JEDEC JESD51-1
INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD – ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)
standard by JEDEC Solid State Technology Association, 12/01/1995
JEDEC
INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD – ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)
standard by JEDEC Solid State Technology Association, 12/01/1995
UNIVERSAL FLASH STORAGE (UFS) SECURITY EXTENSION
standard by JEDEC Solid State Technology Association, 11/01/2016
HIgh Bandwidth Memory DRAM (HBM1, HBM2)
standard by JEDEC Solid State Technology Association, 11/01/2018
DDR3 SDRAM STANDARD
standard by JEDEC Solid State Technology Association, 07/01/2010
STANDARD METHOD FOR MEASURING AND USING THE TEMPERATURE COEFFICIENT OF RESISTANCE TO DETERMINE THE TEMPERATURE OF A METALLIZATION LINE
standard by JEDEC Solid State Technology Association, 02/01/2004
DDR4 NVDIMM-N Design Standard
standard by JEDEC Solid State Technology Association, 03/01/2018
Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 09/01/2019
Embedded Multi-media card (e*MMC), Electrical Standard 5.0
standard by JEDEC Solid State Technology Association, 09/01/2013
DELPHI COMPACT THERMAL MODEL GUIDELINE
standard by JEDEC Solid State Technology Association, 10/01/2008
Alpha Radiation Measurement in Electronic Materials
standard by JEDEC Solid State Technology Association, 05/01/2011