JEDEC JESD22-A117C
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 10/01/2011
JEDEC
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 10/01/2011
TWO-RESISTOR COMPACT THERMAL MODEL GUIDELINE
standard by JEDEC Solid State Technology Association, 07/01/2008
Lognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Method
standard by JEDEC Solid State Technology Association, 08/01/2017
PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 03/01/2010
Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 09/01/2013
REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2012
STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS
standard by JEDEC Solid State Technology Association, 06/01/2013
Wide I/O Single Data Rate (Wide I/O SDR)
standard by JEDEC Solid State Technology Association, 12/01/2011
SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
standard by JEDEC Solid State Technology Association, 09/01/2010
GDDR5 SGRAM
standard by JEDEC Solid State Technology Association, 04/01/2013